High speed and Highly Accurate Tip-Scanning Atomic Force Microscope

High speed and Highly Accurate Tip-Scanning Atomic Force Microscope image
ISBN-10:

3639002709

ISBN-13:

9783639002706

Author(s): Lee, Dong-Yeon
Released: Oct 17, 2013
Format: Paperback, 136 pages
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Description:

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