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Authors /
Lee, Dong-Yeon

Books by Lee, Dong-Yeon

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High speed and Highly Accurate Tip-Scanning Atomic Force Microscope image

High speed and Highly Accurate Tip-Scanning Atomic Force Microscope

Author(s): Lee, Dong-Yeon
ISBN-13: 9783639002706
Publisher: VDM Verlag Dr. Müller
Released: Oct 17, 2013
Format: Paperback, 136 pages
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