I E E E International Test Conference, 1996 (International Test Conference Proceedings)

Name: I E E E International Test Conference, 1996 (International Test Conference Proceedings)
Brand: IEEE Computer Society
SKU: 9780780342095
Rating: 4.7 (8 reviews)
ISBN: 9780780342095

I E E E International Test Conference, 1996 (International Test Conference Proceedings) image

ISBN-10:

0780342097

ISBN-13:

9780780342095

Author(s): International Test Conference (28th : 1997 : Washington, D. C.)

Edition: 1996 ed.

Released: Jan 01, 1997

Publisher: IEEE Computer Society

Format: Paperback, 1000 pages

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Description:

The IEEE Test Conference is one of the largest premier technical conferences on the testing and total quality of integrated electronic circuits and the systems that are based on them. This text covers the 1996 conference.

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