I E E E International Test Conference, 1996 (International Test Conference Proceedings)
ISBN-10:
0780342097
ISBN-13:
9780780342095
Edition: 1996 ed.
Released: Jan 01, 1997
Publisher: IEEE Computer Society
Format: Paperback, 1000 pages
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Description:
The IEEE Test Conference is one of the largest premier technical conferences on the testing and total quality of integrated electronic circuits and the systems that are based on them. This text covers the 1996 conference.
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