I E E E International Test Conference, 1996 (International Test Conference Proceedings)

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I E E E International Test Conference, 1996 (International Test Conference Proceedings) image
ISBN-10:

0780342097

ISBN-13:

9780780342095

Edition: 1996 ed.
Released: Jan 01, 1997
Format: Paperback, 1000 pages

Description:

The IEEE Test Conference is one of the largest premier technical conferences on the testing and total quality of integrated electronic circuits and the systems that are based on them. This text covers the 1996 conference.

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