Statistics, Testing, and Defense Acquisition: New Approaches and Methodological Improvements

Statistics, Testing, and Defense Acquisition: New Approaches and Methodological Improvements image
ISBN-10:

0309065518

ISBN-13:

9780309065511

Edition: First Edition
Released: Jun 08, 1998
Format: Paperback, 240 pages
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Description:

For every weapons system being developed, the U.S. Department of Defense (DOD) must make a critical decision: Should the system go forward to full-scale production? The answer to that question may involve not only tens of billions of dollars but also the nation's security and military capabilities. In the milestone process used by DOD to answer the basic acquisition question, one component near the end of the process is operational testing, to determine if a system meets the requirements for effectiveness and suitability in realistic battlefield settings. Problems discovered at this stage can cause significant production delays and can necessitate costly system redesign.

This book examines the milestone process, as well as the DOD's entire approach to testing and evaluating defense systems. It brings to the topic of defense acquisition the application of scientific statistical principles and practices.

Table of Contents
  • Front Matter
  • Executive Summary
  • 1 Introduction
  • 2 Operational Testing and System Acquisition
  • 3 A New Paradigm for Testing and Evaluation in Defense Acquisition
  • 4 Upgrading Statistical Methods for Testing and Evaluation
  • 5 Improving Operational Test Planning and Design
  • 6 Analyzing and Reporting Test Results
  • 7 Assessing Operational Suitability
  • 8 Testing Software-Intensive Systems
  • 9 Using Modeling and Simulation in Test Design and Evaluation
  • 10 Increasing Access to Statistical Expertise for Operational Testing
  • Appendix A Case Studies and System Descriptions
  • Appendix B Abstracts of Background Papers
  • Appendix C A Potential Taxonomy for Operational Tests
  • Appendix D Elements of ISO 9000
  • Appendix E Glossary and Acronyms
  • References
  • Biographical Sketches of Panel Members and Staff











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