Analysis of Sampled Imaging Systems (SPIE Tutorial Texts in Optical Engineering Vol. TT39)

Analysis of Sampled Imaging Systems (SPIE Tutorial Texts in Optical Engineering Vol. TT39) image
ISBN-10:

0819434892

ISBN-13:

9780819434890

Released: Apr 12, 2000
Format: Paperback, 176 pages
to view more data

Description:

Advances in solid state detector arrays, flat panel displays, and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst--this tutorial's intended reader.

Contents

- Preface
- Introduction
- Fourier integral representation of an optical image
- Sampled imager response function
- Sampled imager design and optimization
- Interlace and Dither
- Dynamic Sampling, Resolution Enhancement, and Super-Resolution
- The Sampling Theorem
- Laboratory Measurements of Sampled Infrared Imaging System Performance
- Appendix A: Fourier integrals and Fourier series
- Appendix B: The impulse function


























We're an Amazon Associate. We earn from qualifying purchases at Amazon and all stores listed here.

Want a Better Price Offer?

Set a price alert and get notified when the book starts selling at your price.

Want to Report a Pricing Issue?

Let us know about the pricing issue you've noticed so that we can fix it.