Selected Papers on Speckle Metrology (S P I E Milestone Series, Vol 35)

Selected Papers on Speckle Metrology (S P I E Milestone Series, Vol 35) image
ISBN-10:

0819406392

ISBN-13:

9780819406392

Author(s): Sirohi; Rajpal S.
Released: Aug 01, 1991
Format: Paperback, 686 pages
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Description:

SPIE Milestones are collections of seminal papers from the world literature covering important discoveries and developments in optics and photonics.












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