Electron Microscopy and Analysis 2001 (Institute of Physics Conference Series)
ISBN-10:
0750308125
ISBN-13:
9780750308120
Edition: 1
Description:
Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Electron Microscopy and Analysis 2001 presents a useful snapshot of the latest developments in instrumentation, analysis techniques, and applications of electron and scanning probe microscopies. The book is ideal for materials scientists, solid state physicists and chemists, and researchers in these areas who want to keep abreast of the state of the art in the field.
We're an Amazon Associate. We earn from qualifying purchases at Amazon and all stores listed here.
Want a Better Price Offer?
Set a price alert and get notified when the book starts selling at your price.
Want to Report a Pricing Issue?
Let us know about the pricing issue you've noticed so that we can fix it.