Books by Xu, Yao

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Dam Failure Mechanisms and Risk Assessment image

Dam Failure Mechanisms and Risk Assessment

Author(s): Peng, Ming
ISBN-13: 9781118558515
Edition: 1
Publisher: wiley
Released: Aug 22, 2016
Format: Hardcover, 450 pages
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Carbon-Based Electronics: Transistors and Interconnects at the Nanoscale image

Carbon-Based Electronics: Transistors and Interconnects at the Nanoscale

Author(s): Xu, Yao
ISBN-13: 9789814613101
Edition: 1
Released: Mar 19, 2015
Format: Hardcover, 156 pages
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