VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

Laung-Terng Wang

Cheng-Wen Wu

Xiaoqing Wen

Morgan Kaufmann

System-on-Chip Test Architectures: Nanometer Design for Testability (ISSN)

Charles E. Stroud

Nur A. Touba

<p>This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI practitioners and researchers in need of fluency in an "adjacent" field will find this an invaluable reference to the basic EDA concepts, principles, data structures, algorithms, and architectures for the design, verification, and test of VLSI circuits. Anyone who needs to learn the concepts, principles, data structures, algorithms, and architectures of the EDA flow will benefit from this book.</p>

Electronic Design Automation: Synthesis, Verification, and Test (Systems on Silicon)

Computers & Technology

Computer Science

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Books by Laung-Terng Wang