Jack C. Lee

Books by Jack C. Lee

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Hf-Based High-k Dielectrics Process Development, Performance Characterization, and Reliability image

Hf-Based High-k Dielectrics Process Development, Performance Characterization, and Reliability

Author(s): Young-Hee, Kim

ISBN-13: 9783031025525

Edition: 2

Publisher: Springer International Publishing

Released: Jun 01, 2022

Format: eBook, 92 pages