<p>This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.</p>
<ul>
<li>Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;</li>
<li>Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;</li>
<li>Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs. </li>
</ul>

Debug Automation from Pre-Silicon to Post-Silicon

Computers & Technology

Fey, Görschwin

Dehbashi, Mehdi

Games & Strategy Guides

Springer

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.

See the best price to sell, buy, or rent books by Dehbashi, Mehdi. BookScouter helps to compare book prices from 25+ online bookstores and 30+ buyback vendors with a single search.

Books by Dehbashi, Mehdi

See the best price to sell, buy, or rent books by Dehbashi, Mehdi. BookScouter helps to compare book prices from 25+ online bookstores and 30+ buyback vendors with a single search.

Debug Automation from Pre-Silicon to Post-Silicon

Debug Automation from Pre-Silicon to Post-Silicon