Books by Chakrabarty, Krishnendu

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Optimization of Trustworthy Biomolecular Quantitative Analysis Using Cyber-Physical Microfluidic Platforms image

Optimization of Trustworthy Biomolecular Quantitative Analysis Using Cyber-Physical Microfluidic Platforms

ISBN-13: 9780367223526
Edition: 1
Publisher: CRC-Press
Released: Jul 10, 2020
Format: Hardcover, 349 pages
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Digital Microfluidic Biochips: Synthesis, Testing, and Reconfiguration Techniques image

Digital Microfluidic Biochips: Synthesis, Testing, and Reconfiguration Techniques

ISBN-13: 9780849390098
Edition: 1
Publisher: CRC-Press
Released: Oct 10, 2006
Format: Hardcover, 244 pages
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Digital Microfluidic Biochips: Design Automation and Optimization image

Digital Microfluidic Biochips: Design Automation and Optimization

ISBN-13: 9781138112407
Edition: 1
Publisher: CRC-Press
Released: Jul 21, 2017
Format: Paperback, 214 pages
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Digital Microfluidic Biochips: Design Automation and Optimization image

Digital Microfluidic Biochips: Design Automation and Optimization

ISBN-13: 9781439819159
Edition: 1
Publisher: CRC-Press
Released: May 03, 2010
Format: Hardcover, 214 pages
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Test and Diagnosis for Small-Delay Defects image

Test and Diagnosis for Small-Delay Defects

ISBN-13: 9781441982964
Edition: 2012
Publisher: Springer
Released: Sep 27, 2011
Format: Hardcover, 230 pages
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Design and Testing of Digital Microfluidic Biochips image

Design and Testing of Digital Microfluidic Biochips

ISBN-13: 9781461403692
Edition: 2012
Publisher: Springer
Released: Jul 24, 2012
Format: Hardcover, 216 pages
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Test and Diagnosis for Small-Delay Defects image

Test and Diagnosis for Small-Delay Defects

ISBN-13: 9781489989529
Edition: 2012
Publisher: Springer
Released: Nov 28, 2014
Format: Paperback, 230 pages
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Design and Testing of Digital Microfluidic Biochips image

Design and Testing of Digital Microfluidic Biochips

ISBN-13: 9781489999344
Edition: 2013
Publisher: Springer
Released: Aug 08, 2014
Format: Paperback, 216 pages
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Wafer-Level Testing and Test During Burn-In for Integrated Circuits (Artech House Integrated Microsystems) image

Wafer-Level Testing and Test During Burn-In for Integrated Circuits (Artech House Integrated Microsystems)

ISBN-13: 9781596939899
Edition: Illustrated
Released: Feb 01, 2010
Format: Hardcover, 198 pages
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Recent Advances in Testing Techniques for AI Hardware Accelerators (Foundations and Trends(r) in Integrated Circuits and Systems) image

Recent Advances in Testing Techniques for AI Hardware Accelerators (Foundations and Trends(r) in Integrated Circuits and Systems)

ISBN-13: 9781638282402
Publisher: Now Publishers
Released: Jun 21, 2023
Format: Paperback, 148 pages
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