Tutorial: Test Generation for Vlsi Chips
ISBN-10:
081868786X
ISBN-13:
9780818687860
Released: Jan 01, 1988
Publisher: IEEE Computer Society
Format: Hardcover, 401 pages
Related ISBN: 9780818647864
Description:
Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial.
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