Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. The book reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections support this kernel: a) failure analysis techniques, procedures and examples; and, b) device-oriented laser modeling and parameter extraction.Provides natural continuity with the most widespread existing textbooksOffers an extension to new failure mechanisms, new technologies, new application fields and new environmentsIntroduces a specific self-consistent model for the physical description of a laser diode, expressed in terms of practically measurable quantitiesIntroduces and explores the application of a practical measurement tool for linking failure modes to failure mechanisms

Advanced Laser Diode Reliability

Engineering & Transportation

Fukuda, Mitsuo

Vanzi, Massimo

Béchou, Laurent

Mura, Giovanna

Engineering

ISTE Press - Elsevier

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