Transient Electromagnetic-Thermal Nondestructive Testing: Pulsed Eddy Current and Transient Eddy Current Thermography covers three key areas of theories, methods and applications, primarily the multi-physics field, including eddy current, heat conduction and Infrared radiation for defect evaluation, lateral heat conduction, which is analyzed to detect parallel cracks, and longitudinal heat conduction, which is analyzed to detect depth defect, or that which is beyond skin depth.  In addition, the book explores methods, such as time domain, frequency domain and logarithm domain, also comparing A-scan , B-scan and C-scan. Sections on defect identification, classification and quantification are covered, as are advanced algorithms, principal components analysis (PCA), independent components analysis (ICA) and support vector machine (SVM).  The book uses a lot of experimental studies on multi-layer aluminum structures, honeycomb structure, CFRP in the aerospace field, and steel and coating in the marine rail and transportation fields. Presents two kinds of transient NDT testing, from theory and methodology, to applicationsIncludes time domain frequency domain and logarithm domain, which are all analyzedIntroduces A-scan , B-scan and C-scan, which are compared Provides experimental studies for real damages, including corrosion and blister in steel, stress in aluminum, impact and delamination in CFRP laminates and RCF cracks are abundant

Transient Electromagnetic-Thermal Nondestructive Testing: Pulsed Eddy Current and Transient Eddy Current Thermography

Engineering & Transportation

He, Yunze

Gao, Bin

Sophian, Ali

Yang, Ruizhen

Engineering

Elsevier

<p><p>This book introduces the state-of-the-art research progress of system-level EMC, including theories, design technologies, principles and applications in practice. The engineering design, simulation, prediction, analysis, test, stage control as well as effectiveness evaluation are discussed in detail with extensive project experiences, making the book an essential reference for researchers and industrial engineers.</p></p>

Design Technology of System-Level EMC Engineering

Science & Math

张羽

Tang, Xiaobin

Physics

Walter de Gruyter

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Books by Gao, Bin