<p>Thoroughly surveys the physics of failure mechanisms in semiconductor devices, from the semiconductor dye itself to the packaging and interconnections. Its specific intention is to identify the processes leading to damage and the techniques used to repair or detect it. Discusses and critiques accelerated lifetesting and how the various tests apply to different failure mechanisms. Also provides a critical review of reliability modelling and estimation and techniques, and quality assurance and screening techniques, emphasizing the complexity of present-generation integrated circuits. Throughout, suggestions are offered on ways to improve the quality of devices.</p>

Failure Mechanisms in Semiconductor Devices

Engineering & Transportation

Amerasekera, E. Ajith

Campbell, D. S.

Engineering

wiley

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Books by Campbell, D. S.

See the best price to sell, buy, or rent books by Campbell, D. S.. BookScouter helps to compare book prices from 25+ online bookstores and 30+ buyback vendors with a single search.

Failure Mechanisms in Semiconductor Devices